Test Generation of Crosstalk Delay Faults in VLSI Circuits
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1817.00
发货周期：外国库房发货，通常付款后3-5周到货
出版时间
2018年10月10日
装 帧
页 码
156
语 种
英文
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图书简介
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
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