Test and Diagnosis for Small-Delay Defects

小延迟缺陷的测试和诊断

工程热物理

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作      者
出  版 社
出版时间
2011年09月27日
装      帧
精装
ISBN
9781441982964
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页      码
212
语      种
英文
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图书简介
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
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