Built-in-Self-Test and Digital Self-Calibration for RF SoCs(SpringerBriefs in Electrical and Computer Engineering)

射频系统芯片的内建自测试和数字自校准(丛书)

工程热物理

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542.00
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作      者
出  版 社
出版时间
2011年09月22日
装      帧
平装
ISBN
9781441995476
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页      码
89
语      种
英文
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图书简介
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. 
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