FUNDAMENTALS OF ATOMIC FORCE MICROSCOPY - PART I:FOUNDATIONS(LESSONS FROM NANOSCIENCE: A LECTURE NOTES SERIES)

原子力显微镜基本原理:第一部分:基础

材料科学基础学科

原   价:
456.00
售   价:
342.00
发货周期:预计3-5周发货
作      者
出  版 社
出版时间
2015年09月29日
装      帧
平装
ISBN
9789814630351
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页      码
340
语      种
英文
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图书简介
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Key Features: ○ Provides an introductory review of many relevant background topics that are often assumed to be understood by students ○ Worked out examples and homework problems are at the end of each chapter ○ Useful as a study guide to “Fundamentals of AFM”, an online video course available at https: //nanohub.org/courses/AFM1/
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