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1 : Basic Principles of Engineering Metrology; 1.1 Introduction; 1.2 Metrology Defined; 1.3 Need for Inspection; 1.4 Accuracy and Precision; 1.4.1 Accuracy and Cost; 1.5 Objectives of Metrology and Measurements; 1.6 General Measurement Concepts; 1.6.1 Calibration of Measuring Instruments; 1.7 Error in Measurements; 1.7.1 Systematic and Controllable Errors; 1.7.2 Random Errors; 1.8 Methods of Measurement; 2 : Standards of Measurement; 2.1 Introduction; 2.2 Standards and their Roles; 2.3 Evolution of Standards; 2.4 The National Physical Laboratory (NPL); 2.5 Material Standard; 2.5.1 Yard; 2.5.2 Metre; 2.5.3. Disadvantages of Material Standard; 2.6 Wavelength Standard; 2.6.1 The Modern Metre; 2.7 Subdivisions of Standards; 2.8 Line and End Measurement; 2.8.1 Characteristics of Line Standards; 2.8.2 Characteristics of End Standards; 2.8.3 Transfer from Line Standard to End Standard; 2.9 Brookes Level Comparator; 2.10 Displacement Method; 2.11 Calibration of End Bars; 3 : Limits, Fits, and Tolerances; 3.1 Introduction; 3.2 Principle of Interchangeability; 3.2.1 Selective Assembly Approach; 3.3 Tolerances; 3.3.1 Computer Aided Modelling; 3.3.2 Manufacturing Cost and Work Tolerance; 3.3.3 Classification of Tolerances; 3.4 Maximum and Minimum Metal Conditions; 3.5 Fits; 3.5.1 Allowance; 3.5.2 Hole Basis and Shaft Basis System; 3.6 Systems of Limits and Fits; 3.6.1 General Terminologies; 3.6.2 Limit Gauging; 3.6.3 Classification of Gauges; 3.6.4 Taylor’s Principle; 3.6.5 Important guidelines for gauge design; 3.6.6 Material for Gauges; 3.6.7 Gauge Tolerance; 3.6.8 Wear Allowance; 3.6.9 Methods of Tolerance Specification on Gauges; 3.7 Plain Plug Gauges; 3.8 Snap Gauges; 4 : Linear Measurements; 4.1 Introduction; 4.2 Design of Linear Measurement Instruments; 4.3 Surface Plate; 4.4 V Blocks; 4.5 Graduated Scales; 4.6 Scaled Instruments; 4.6.1 Depth Gauge; 4.6.2 Combination Set; 4.6.3 Calipers; 4.7 Vernier Instruments; 4.7.1 Vernier Calipers; 4.7.2 Vernier Depth Gauge; 4.7.3 Vernier Height Gauge; 4.8 Micrometer Instruments; 4.8.1 Outside Micrometer; 4.8.2 Vernier Micrometer; 4.8.3 Digital Micrometer; 4.8.4 Inside Micrometer Caliper; 4.8.5 Inside Micrometer; 4.8.6 Depth Micrometer; 4.8.7 Floating Carriage Micrometer; 4.9 Slip Gauges; 4.9.1 Gauge Block Shapes, Grades and Sizes; 4.9.2 Wringing of Slip Gauges; 4.9.3 Manufacture of Slip Gauges; 4.9.4 Calibration of Slip Gauges; 5 : Angular Measurement; 5.1 Introduction; 5.2 Protractor; 5.2.1 Universal Bevel Protractor; 5.2.2 Optical Bevel Protractor; 5.3 Sine Bar; 5.3.1 Sine Blocks, Sine Plates, and Sine Tables; 5.3.2 Sine Centre; 5.4 Angle Gauges; 5.4.1 Uses of Angle Gauges; 5.4.2 Manufacture and calibration of angle gauges; 5.4.3 True Square; 5.5 Spirit Level; 5.5.1 Clinometer; 5.6 Optical Instruments for Angular Measurement; 5.6.1 Autocollimator; 5.6.2 Autocollimator Applications; 5.6.3 Angle Dekkor; 6 : Comparators; 6.1 Introduction; 6.2 Functional Requirements; 6.3 Classification of Comparators; 6.4 Mechanical Comparators; 6.4.1 Dial Indicators; 6.4.2 Johansson Microkator; 6.4.3 Sigma Comparator; 6.5 Mechanical Optical Comparator; 6.5.1 Zeiss Ultra Optimeter; 6.5.2 Optical Projector; 6.6 Electrical and Electronic Comparators; 6.6.1 LVDT; 6.6.2 Electronic Comparator; 6.7 Pneumatic Comparator; 6.7.1 Free Flow Air Gauge; 6.7.2 Back Pressure Gauge; 6.7.3 Solex Pneumatic Gauge; 6.7.4 Applications of Pneumatic Comparators; 7 : Optical Measurements and Interferometry; 7.1 Introduction; 7.2 Optical Measurement Techniques; 7.2.1 Tool Maker’s Microscope; 7.2.2 Profile Projector; 7.2.3 Optical Squares; 7.3 Optical Interference; 7.4 Interferometry; 7.4.1 Optical Flats; 7.5 Interferometers; 7.5.1 The NPL Flatness Interferometer; 7.5.2 Pitter-NPL Gauge Interferometer; 7.5.3 Laser Interferometers; 7.6 Scales, Grating, and Reticles; 7.6.1 Scales; 7.6.2 Gratings; 7.6.3 Reticles; 8 : Metrology of Gears and Screw Threads; 8.1 Introduction; 8.2 Gear Terminology; 8.3 Error in Spur Gears; 8.4 Measurement of Gear Elements; 8.5 Composite Method of Gear Inspection; 8.5.1 Parkinson Gear Tester; 8.6 Measurement of Screw Threads; 8.7 Screw Thread Terminology; 8.8 Measurement of Screw Thread Elements; 8.8.1 Measurement of Major Diameter; 8.8.2 Measurement of Minor Diameter; 8.8.3 Measurement of Effective Diameter; 8.8.4 Measurement of Pitch; 8.9 Thread Gauges; 9 : Metrology of Surface Finish; 9.1 Introduction; 9.2 Surface Metrology Concepts; 9.3 Terminologies; 9.4 Analysis of Surface Traces; 9.4.1 Ten Point Height Average Value; 9.4.2 Root Mean Square Value; 9.4.3 Central Line Average Value; 9.5 Specification of Surface Texture Characteristics; 9.6 Methods of Measuring Surface Finish; 9.7 Stylus System of Measurement; 9.7.1 The Stylus and Datum; 9.8 Stylus Probe Instruments; 9.8.1 Tomlinson Surface Meter; 9.8.2 Taylor-Hobson Talysurf; 9.8.3 Profilometer; 9.9 Wavelength, Frequency, and Cutoff; 9.10 Other Methods of Measuring Surface Roughness; 9.10.1 Pneumatic Method; 9.10.2 Light Interference Microscope; 9.10.3 Mecrin Instrument; 10 : Miscellaneous Metrology; 10.1 Introduction; 10.2 Precision Instrumentation based on Laser Principles; 10.3 Coordinate Measuring Machines (CMM); 10.3.1 Structure of CMM; 10.3.2 Modes of Operation; 10.3.3 The Probe; 10.3.4 Operation of CMM; 10.3.5 Major Applications of CMM; 10.4 Machine Tool Metrology; 10.4.1 Straightness, Flatness, Parallelism, Squareness, Roundness, Cylindricity, and Runout; 10.4.2 Acceptance Test for Machine Tools; 10.5 Automated Inspection; 10.6 Machine Vision; 10.6.1 Stages of Machine Vision; 10.6.2 Applications of Machine Vision in Inspection; 11 : Inspection and Quality Control; 11.1 Introduction; 11.2 Inspection; 11.3 Specifying the Limits of Variability; 11.4 Dimensions and Tolerances; 11.5 Selection of Gauging Equipment; 11.6 Gauge Control; 11.7 Quality Control and Quality Assurance; 11.8 Statistical Quality Control; 11.8.1 Process Variability; 11.8.2 Importance of Sampling; 11.8.3 SQC by Attributes; 11.8.4 SQC by Variables; 11.9 Total Quality Management; 11.9.1 Customer Focus; 11.9.2 Continuous Improvement; 11.9.3 Employee Empowerment; 11.9.4 Use of Quality Tools; 11.9.5 Product Design; 11.9.6 Process Management; 11.9.7 Managing Supplier Quality; 11.10 Six Sigma; 11.10.1 Six Sigma Approach; 11.10.2 Training for Six Sigma; 11.11 Quality Standards; 11.11.1 Quality Management Principles of ISO 9000; 11.11.2 Implementing ISO Standards; 12 : Measurement Systems; 12.1 Introduction; 12.2 Some Basic Definitions; 12.2.1 Hysteresis in Measurement Systems; 12.2.2 Linearity in Measurement Systems; 12.2.3 Resolution of Measuring Instruments; 12.2.4 Threshold; 12.2.5 Drift; 12.2.6 Zero Stability; 12.2.7 Loading Effects; 12.2.8 System Response; 12.3 Functional Elements of Measurement Systems; 12.4 Primary Detector-Transducer Stage; 12.5 The Intermediate Modifying Stage; 12.6 The Output or Terminating Stage; 13 : Transducers; 13.1 Introduction; 13.2 Transfer Efficiency; 13.3 Classification of Transducers; 13.3.1 Primary and Secondary Transducers; 13.3.2 Based on Principles of Transduction; 13.3.3 Active and Passive Transducers; 13.3.4 Analog and Digital Transducers; 13.3.5 Transducers and Inverse Transducers; 13.3.6 Null and Deflection Type Transducers; 13.4 Quality Attributes for Transducers; 13.5 Intermediate Modifying Devices; 13.5.1 Inherent Problems in Mechanical Systems; 13.5.2 Kinematic Linearity; 13.5.3 Mechanical Amplification; 13.5.4 Reflected Frictional Amplification; 13.5.5Reflected Inertial Amplification; 13.5.6 Amplification of Backlash and Elastic Deformation; 13.5.7 Tolerance Problems; 13.5.8 Temperature Problems; 13.6 Electrical Intermediate Modifying Devices; 13.6.1 Input Circuitry; 13.6.2 Simple Current Sensitive Circuit; 13.6.3 Ballast Circuit; 13.6.4 Electronic Amplifiers; 13.6.5 Telemetry; 13.7 Advantages of Electrical Intermediate Modifying Devices; 13.8 Terminating Devices; 13.8.1 Metering Indicators; 13.8.2 Mechanical Counters; 13.8.3 Cathode Ray Oscilloscope (CRO); 13.8.4 Oscillographs; 13.8.5 X-Y Plotters; 13.8.6 Stroboscopic Measurements; 14 : Measurement of Force, Torque, and Strain; 14.1 Introduction; 14.2 Measurement of Force; 14.2.1 Direct Methods; 14.3 Elastic Members; 14.3.1 Load Cells; 14.3.2 Cantilever Beams; 14.3.3 Proving Rings; 14.3.4 Differential Transformers; 14.4 Measurement of Torque; 14.4.1 Torsion Bar Dynamometer; 14.4.2 Servo Controlled Dynamometers; 14.4.3 Absorption Dynamometers; 14.5 Measurement of Strain; 14.5.1 Mechanical Strain Gauges; 14.5.2 Electrical Strain Gauges; 14.6 Strain Gauge Materials; 14.7 Backing or Carrier Materials; 14.9 Adhesives; 14.10 Protective Coatings; 14.11 Bonding of Gauges; 14.12 Gauge Factor; 14.13 Theory of Strain Gauges; 14.14 Methods of Strain Measurements; 14.15 Strain Gauge Bridge Arrangement; 14.16 Temperature Compensation in Strain Gauges; 14.16.1 Adjacent Arm Compensating Gauges; 14.16.2 Self Temperature Compensation; 15 : Temperature Measurement; 15.1 Introduction; 15.2 Methods of Measuring Temperature; 15.3 Thermocouples; 15.3.1 Law of Thermocouples; 15.3.2 Thermocouple Materials; 15.3.3 Thermopiles; 15.4 Resistance Temperature Detectors (RTD); 15.5 Thermistors; 15.6 Liquid In Glass Thermometers; 15.7 Pressure Thermometers; 15.8 Bimetallic Strip Thermometers; 15.9 Pyrometry; 15.9.1 Total Radiation Pyrometer; 15.9.2 Optical Pyrometer; 15.9.3 Fibre Optic Pyrometers; 16 : Pressure Measurement; 16.1 Introduction; 16.2 Pressure Measurement Scales; 16.3 Methods of Pressure Measurement; 16.3.1 Static Pressure Measurement; 16.3.2 Classification of Pressure Measuring Devices; 16.3.3 Manometers for Pressure Measurement; 16.4 Ring Balance; 16.5 Inverted Bell Manometer; 16.6 Elastic Transducers; 16.7 Elastic Pressure Transducers; 16.7.1 Resistance Type Transducers; 16.7.2 Potentiometer Devices; 16.7.3 Inductive Type Transducer; 16.7.4 Capacitive Type Pressure Transducer; 16.7.5 Piezo Electric Type Pressure Transducer; 16.7.6 Varying Pressure Measurement; 16.8 Dead Weight Pressure Gauge; 16.9 Measurement of Vacuum; 16.9.1 McLeod Gauge; 16.9.2 Pirani Gauge; 16.9.3 Ionization Gauge; 16.9.4 Knudsen Gauge; 16.10 Measurement of High Pressure; 17 : Nanometrology; 17.1 Introduction; 17.2 Nanotechnology; 17.2.1 Importance of Nano Dimension; 17.2.1 Classification of Nanostructures; 17.2.3 Applications; 17.3 Importance of Nanometrology; 17.4 Introduction to Microscopy; 17.4.1 Transmission Electron Microscope (TEM); 17.4.2 Scanning Electron Microscope (SEM); 17.4.3 Scanning Tunnelling Microscope (STM); 17.4.4 Atomic Force Microscope (AFM); 17.5 X-ray Diffraction System (XRD); Appendix A: Universal Measuring Machine; Appendix B: Fluid Flow Measurements; Appendix C: Laboratory Manual; Appendix D: Quality Control Charts

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