¥ 442
Bouchaud / 2001-08-15 / Springer Netherlands
¥ 1326
Bainbridge / 2001-08-15 / Springer Netherlands
¥ 2960
Nalwa, Hari / 2001-08-01 / Academic Press
¥ 299
J. M. Drake / 2001-08-01 / Cambridge University Press
¥ 884
Neustupa / 2001-08-01 / Birkhaeuser Verlag Basel
¥ 2518
Vlado A. Lubarda / 2001-07-16 / CRC Press
¥ 2610
Hollaway, L.C. / 2001-07-01 / Elsevier Science
¥ 1224
Hayes / 2001-06-15 / Springer Wien
¥ 884
Ehrhard / 2001-06-15 / Springer Netherlands
¥ 884
Lu, L.;Li Lu, Lu;Fuh, J. / 2001-06-15 / Springer US
¥ 498
Davis, Claire / 2001-06-01 / CRC Press
¥ 1917
MORAWIEC H & STROZ D / 2001-05-31 / World Scientific Publishing
¥ 1326
Pluvinage / 2001-05-15 / Springer Netherlands
¥ 1326
Pluvinage / 2001-05-15 / Springer Netherlands
¥ 1326
Tucker, P. G.;Tucker, Paul G. / 2001-05-15 / Springer US
¥ 4928
Spe / 2001-05-07 / CRC Press
¥ 1325
Xiangdong (Shawn) Feng / 2001-05-01 / The American Ceramics Society (ACerS)
¥ 3690
Bandyopadhyay / 2001-04-30 / CRC Press
¥ 1946
Itoh, Kiyoo / 2001-04-20 / Springer Berlin Heidelberg
¥ 2652
Bendavid / 2001-04-20 / Springer New York
¥ 2244
Xavier Maldague / 2001-04-16 / Wiley-Interscience
¥ 578
PASHLEY DON W / 2001-04-10 / World Scientific Publishing
¥ 310
Schiebinger, Londa / 2001-04-02 / Harvard University Press
¥ 1598
Borisenko V E et al / 2001-04-02 / World Scientific Publishing
¥ 626
Yeomans, Julie() / 2001-04-01 / CRC Press
¥ 2157
Cheremisinoff, Nicholas P / 2001-04-01 / Butterworth-Heinemann
¥ 4107
Russell H. Jones / 2001-03-29 / CRC Press
¥ 2139
Scherge / 2001-03-20 / Springer Berlin Heidelberg
¥ 884
Biro / 2001-03-15 / Springer Netherlands
¥ 884
Biro / 2001-03-15 / Springer Netherlands
¥ 1314
Yoo, Kim Ill / 2001-03-12 / CRC Press
¥ 3636
Frca / 2001-03-02 / CRC Press
¥ 2957
U.K. Chatterjee, S.K. Bose and S.K. Roy / 2001-03-02 / CRC Press
¥ 2610
Green, R.E. / 2001-03-01 / Elsevier Science
¥ 802
Cahn, R.W. / 2001-03-01 / Pergamon Press
¥ 5706
Yuji Matsuzaki / 2001-03-01 / CRC Press
¥ 1035
Isaac Elishakoff / 2001-03-01 / Cambridge University Press
¥ 1829
Hoffmann Karl-HeinzHoffmann K. H. / 2001-03-01 / Springer